Haze of surface random systems: An approximate analytic approach

Ingve Simonsen, Åge Larsen, Erik Andreassen, Espen Ommundsen, and Katrin Nord-Varhaug
Phys. Rev. A 79, 063813 – Published 8 June 2009

Abstract

Approximate analytic expressions for haze (and gloss) of Gaussian randomly rough surfaces for various types of correlation functions are derived within phase-perturbation theory. The approximations depend on the angle of incidence, polarization of the incident light, the surface roughness, σ, and the average of the power spectrum taken over a small angular interval about the specular direction. In particular it is demonstrated that haze (gloss) increase (decrease) with σ/λ as exp[A(σ/λ)2] and decreases (increase) with a/λ, where a is the correlation length of the surface roughness, in a way that depends on the specific form of the correlation function being considered. These approximations are compared to what can be obtained from a rigorous Monte Carlo simulation approach, and a good agreement is found over large regions of parameter space. Some experimental results for the angular distribution of the transmitted light through polymer films and their haze are presented and compared to the analytic approximations derived in this paper. A satisfactory agreement is found. In the literature haze of blown polyethylene films has been related to surface roughness. Few authors have quantified the roughness and others have pointed to the difficulty in finding the correct roughness measure.

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  • Received 12 January 2009

DOI:https://doi.org/10.1103/PhysRevA.79.063813

©2009 American Physical Society

Authors & Affiliations

Ingve Simonsen*

  • Department of Physics, Norwegian University of Science and Technology (NTNU), NO-7491 Trondheim, Norway and NORDITA, Blegdamsvej 17, DK-2100 Copenhagen Ø, Denmark

Åge Larsen and Erik Andreassen

  • SINTEF Materials and Chemistry, P.O. Box 124 Blindern, NO-0314 Oslo, Norway

Espen Ommundsen§

  • Norner Innovation AS, NO-3960 Stathelle, Norway

Katrin Nord-Varhaug

  • REC Wafer Norway AS, Tormod Gjestlandsveg 31, NO-3908 Porsgrunn, Norway

  • *URL: http://web.phys.ntnu.no/~ingves;ingvesimonsen@ phys.ntnu.no
  • age.larsen@sintef.no
  • erik.andreassen@sintef.no
  • §espen.ommundsen@norner.no
  • katrin.nord-varhaug@recgroup.com

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Issue

Vol. 79, Iss. 6 — June 2009

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