Lifetime statistics in chaotic dielectric microresonators

Henning Schomerus, Jan Wiersig, and Jörg Main
Phys. Rev. A 79, 053806 – Published 4 May 2009

Abstract

We discuss the statistical properties of lifetimes of electromagnetic quasibound states in dielectric microresonators with fully chaotic ray dynamics. Using the example of a resonator of stadium geometry, we find that a recently proposed random-matrix model very well describes the lifetime statistics of long-lived resonances, provided that two effective parameters are appropriately renormalized. This renormalization is linked to the formation of short-lived resonances, a mechanism also known from the fractal Weyl law and the resonance-trapping phenomenon.

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  • Received 15 December 2008

DOI:https://doi.org/10.1103/PhysRevA.79.053806

©2009 American Physical Society

Authors & Affiliations

Henning Schomerus

  • Department of Physics, Lancaster University, Lancaster LA1 4YB, United Kingdom

Jan Wiersig

  • Institut für Theoretische Physik, Universität Magdeburg, Postfach 4120, D-39016 Magdeburg, Germany

Jörg Main

  • 1. Institut für Theoretische Physik, Universität Stuttgart, 70550 Stuttgart, Germany

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Vol. 79, Iss. 5 — May 2009

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