X-ray spectroscopy reveals high symmetry and electronic shell structure of transition-metal-doped silicon clusters

J. T. Lau, K. Hirsch, Ph. Klar, A. Langenberg, F. Lofink, R. Richter, J. Rittmann, M. Vogel, V. Zamudio-Bayer, T. Möller, and B. v. Issendorff
Phys. Rev. A 79, 053201 – Published 22 May 2009

Abstract

Size-selected cationic transition-metal-doped silicon clusters have been studied with x-ray absorption spectroscopy at the transition-metal L2,3 edges to investigate the local electronic structure of the dopant atoms. For VSi16+, the x-ray absorption spectrum is dominated by sharp transitions which directly reveal the formation of a highly symmetric silicon cage around the vanadium atom. In spite of their different number of valence electrons, a nearly identical local electronic structure is found for the dopant atoms in TiSi16+, VSi16+, and CrSi16+. This indicates strongly interlinked electronic and geometric properties: while the transition-metal atom imposes a geometric rearrangement on the silicon cluster, the interaction with the highly symmetric silicon cage determines the local electronic structure of the transition-metal dopant.

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  • Received 22 January 2009

DOI:https://doi.org/10.1103/PhysRevA.79.053201

©2009 American Physical Society

Authors & Affiliations

J. T. Lau*, K. Hirsch, Ph. Klar, A. Langenberg, F. Lofink, R. Richter, J. Rittmann, M. Vogel, V. Zamudio-Bayer, and T. Möller

  • Institut für Optik und Atomare Physik, Technische Universität Berlin, EW 3-1, Hardenbergstraße 36, D-10623 Berlin, Germany

B. v. Issendorff

  • Fakultät für Physik, Universität Freiburg, Stefan-Meier-Straße 19, D-79104 Freiburg, Germany

  • *tobias.lau@physik.tu-berlin.de

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Issue

Vol. 79, Iss. 5 — May 2009

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