Abstract
We present a remarkably accurate method for determining the wave field of an x-ray nanobeam. The intensity profile of a beam was directly measured over a range of three orders of magnitude while its phase distribution was successfully recovered using an iterative algorithm. The evolution of the wave field along the beam propagation direction was precisely simulated, and there was good agreement with the experimental results.
- Received 21 May 2007
DOI:https://doi.org/10.1103/PhysRevA.77.015812
©2008 American Physical Society