Precision lifetime measurements of a single trapped ion with ultrafast laser pulses

D. L. Moehring, B. B. Blinov, D. W. Gidley, R. N. Kohn, Jr., M. J. Madsen, T. D. Sanderson, R. S. Vallery, and C. Monroe
Phys. Rev. A 73, 023413 – Published 14 February 2006

Abstract

We report precision measurements of the excited state lifetime of the 5p P122 and 5p P322 levels of a single trapped Cd+ ion. Combining ion trap and ultrafast laser technologies, the ion is excited with picosecond laser pulses from a mode-locked laser and the distribution of arrival times of spontaneously emitted photons is recorded. The resulting lifetimes are 3.148±0.011ns and 2.647±0.010ns for P122 and P322 respectively. With a total uncertainty of under 0.4%, these are among the most precise measurements of any atomic state lifetimes to date.

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  • Received 15 May 2005

DOI:https://doi.org/10.1103/PhysRevA.73.023413

©2006 American Physical Society

Authors & Affiliations

D. L. Moehring*, B. B. Blinov, D. W. Gidley, R. N. Kohn, Jr., M. J. Madsen, T. D. Sanderson, R. S. Vallery, and C. Monroe

  • FOCUS Center and Department of Physics, University of Michigan, Ann Arbor, Michigan 48109-1040, USA

  • *Electronic address: dmoehrin@umich.edu

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Vol. 73, Iss. 2 — February 2006

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