Partial dissociative ionization of SF6 by electron impact using an ejected electron-ion coincidence technique

R. K. Singh, R. Hippler, and R. Shanker
Phys. Rev. A 67, 022704 – Published 14 February 2003
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Abstract

The relative differential partial ionization cross sections for the production of ionic fragments of SF6 molecule under impact of 10–20 keV electrons have been measured using an ejected electron-produced ion coincidence technique in a crossed beam apparatus with a time-of-flight analysis of the ions. The detection angle of the ejected electrons of nondiscriminated energies was kept at 90° with respect to the incident electron-beam direction. The 14 ionic fragments: SF5+, SF4+, SF3+, SF2+, SF+, S+, F+, SF42+, SF32+, SF22+, S2+, F2+, SF33+, and S3+ resulting from the dissociative ionization of the SF6 molecule were identified and their relative production cross sections have been measured. The branching ratios of 8 ionic fragments SFmn+ (m=1 to 5 and n=1 to 3) as a function of impact energy have been determined. These ratios are found to have an almost a constant value over the considered impact energy range within the experimental uncertainty of the measurements. For the investigated impact energies, no previous data or theoretical calculations exist for a direct comparison with the present results.

  • Received 12 September 2002

DOI:https://doi.org/10.1103/PhysRevA.67.022704

©2003 American Physical Society

Authors & Affiliations

R. K. Singh1, R. Hippler2, and R. Shanker1,*

  • 1Atomic Physics Laboratory, Physics Department, Banaras Hindu University, Varanasi-221 005, India
  • 2Fachbereich Physik, Universität Greifswald, Domstrasse 10a, 17487-Greifswald, Germany

  • *Corresponding author. Email address: rshanker@banaras.ernet.in

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Vol. 67, Iss. 2 — February 2003

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