Dielectronic recombination of Ne-like tungsten

Relativistic calculations of the dielectronic recombination (DR) cross section and rate coefficient for Ne-like tungsten $\left({\mathrm{W}}^{64+}\right)$ in the ground state ${2s}^2{2p}^6$ are performed. The DR contributions of the most important Na-like doubly excited configuration complexes, namely, ${\mathrm{}\left(2s2p\right)\mathrm{}}^7{3ln}^{\prime }{l}^{\prime }$ ${(n}^{\prime }=3\mathrm{}–13)$ and ${\mathrm{}\left(2s2p\right)\mathrm{}}^7{4l4l}^{\prime },$ are calculated by level-by-level computations. Collisional transitions following the initial electron capture are neglected. The total DR cross section is presented in the form of 5-eV-wide peaks for the purpose of revealing the detailed atomic level structure, and in the form of 50-eV-wide peaks for the purpose of comparison with planned electron-beam experiments. The ${\mathrm{}\left(2s2p\right)\mathrm{}}^7{3l3l}^{\prime }$ complex is found to provide the dominant DR channel. The sum of the DR contributions of the ${\mathrm{}\left(2s2p\right)\mathrm{}}^7{3ln}^{\prime }{l}^{\prime }$ configurations with $n^{\prime }>13,$ evaluated by applying the complex-by-complex $n^{\prime -3}$ extrapolation method, is found to represent at most 3% of the total DR rate coefficient. The DR contribution of ${\mathrm{}\left(2s2p\right)\mathrm{}}^7{3ln}^{\prime }{l}^{\prime }$ configurations with $l^{\prime }>5\mathrm{}$ is found to be negligible (about 0.1%). The total DR rate coefficient is fitted to a convenient analytical expression which reproduces the original data with an accuracy of about 2% or better within a very wide electron temperature range.