High-resolution threshold photodetachment spectroscopy of OH

Jim R. Smith, Joseph B. Kim, and W. C. Lineberger
Phys. Rev. A 55, 2036 – Published 1 March 1997
PDFExport Citation

Abstract

Relative photodetachment cross sections for rotational thresholds of the hydroxide anion were measured using a coaxial laser-ion beam spectrometer. The thresholds correspond to transitions from the J=1 and J=2 states of X1Σ+ OH to the J=3/2 state of X2Π3/2 OH. Best fits of the data give cross sections that scale with energy above threshold as (E-Eth)0.18±0.06 and (E-Eth)0.21±0.05 for the two thresholds, respectively. This non-Wigner law energy dependence of the cross section results from the long-range r2 interaction between the dipole and the departing electron. Experimental results were compared with the predictions of a strong-coupling model of charge-dipole interaction devised by Engelking and good qualitative agreement was observed. When the resolution and range of the data for transitions that terminate in the lower Λ-doublet component is such that the Λ-doublet splitting is resolved, one observes the (E-Eth)1/2 behavior predicted by the Wigner law. This result is explained in terms of the effect of the Λ doubling upon the r2 charge-dipole interaction. From the threshold frequencies, an OH electron affinity of 14 741.02(3) cm1 was determined.

  • Received 26 September 1996

DOI:https://doi.org/10.1103/PhysRevA.55.2036

©1997 American Physical Society

Authors & Affiliations

Jim R. Smith, Joseph B. Kim, and W. C. Lineberger

  • Department of Chemistry and Biochemistry and JILA, University of Colorado and National Institute of Standards and Technology, Boulder, Colorado 80309

References (Subscription Required)

Click to Expand
Issue

Vol. 55, Iss. 3 — March 1997

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review A

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×