Cyclotron Resonance of Electrons and Holes in Silicon and Germanium Crystals

G. Dresselhaus, A. F. Kip, and C. Kittel
Phys. Rev. 98, 368 – Published 15 April 1955
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Abstract

An experimental and theoretical discussion is given of the results of cyclotron resonance experiments on charge carriers in silicon and germanium single crystals near 4°K. A description is given of the light-modulation technique which gives good signal-to-noise ratios. Experiments with circularly polarized microwave radiation are described. A complete study of anisotropy effects is reported. The electron energy surfaces in germanium near the band edge are prolate spheroids oriented along 111 axes with longitudinal mass parameter ml=(1.58±0.04)m and transverse mass parameter mt=(0.082±0.001)m. The electron energy surfaces in silicon are prolate spheroids oriented along 100 axes with ml=(0.97±0.02)m; mt=(0.19±0.01)m. The energy surfaces for holes in both germanium and silicon have the form E(k)=Ak2±[B2k4+C2(kx2ky2+ky2kz2+kz2kx2)]12. We find, for germanium, A=(13.0±0.2)(22m), |B|=(8.9±0.1)(22m), |C|=(10.3±0.2)(22m); and for silicon, A=(4.1±0.2)(22m), |B|=(1.6±0.2)(22m), |C|=(3.3±0.5)(22m). A discussion of possible systematic errors in these constants is given in the paper.

  • Received 16 December 1954

DOI:https://doi.org/10.1103/PhysRev.98.368

©1955 American Physical Society

Authors & Affiliations

G. Dresselhaus, A. F. Kip, and C. Kittel

  • Department of Physics, University of California, Berkeley, California

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Issue

Vol. 98, Iss. 2 — April 1955

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