He II Film Profile and Relative Importance of Height and Surface Pressure

O. T. Anderson, D. H. Liebenberg, and J. R. Dillinger
Phys. Rev. 117, 39 – Published 1 January 1960
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Abstract

The thickness d of the He II film at 1.40°K vs height h to 40 cm has been measured by an optical method. Results agree better with an expression of the form d=kh13 than with d=kh12 or h=(ad)3+(bd)2. Evidence was obtained suggesting that the contour of the film cannot be accounted for by considering it to be an adsorbed film subjected to a varying pressure. The pressure would decrease with height due to gravitational effects in a vertical gas column.

  • Received 29 July 1959

DOI:https://doi.org/10.1103/PhysRev.117.39

©1960 American Physical Society

Authors & Affiliations

O. T. Anderson*, D. H. Liebenberg, and J. R. Dillinger

  • University of Wisconsin, Madison, Wisconsin

  • *Now at International Business Machines Corporation, Poughkeepsie, New York.

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Vol. 117, Iss. 1 — January 1960

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