Abstract
We propose entanglement negativity as a fine-grained probe of measurement-induced criticality. We motivate this proposal in stabilizer states, where for two disjoint subregions, comparing their “mutual negativity” and their mutual information leads to a precise distinction between bipartite and multipartite entanglement. In a measurement-only stabilizer circuit that maps exactly to two-dimensional critical percolation, we show that the mutual information and the mutual negativity are governed by boundary conformal fields of different scaling dimensions at long distances. We then consider a class of “hybrid” circuit models obtained by perturbing the measurement-only circuit with unitary gates of progressive levels of complexity. While other critical exponents vary appreciably for different choices of unitary gate ensembles at their respective critical points, the mutual negativity has scaling dimension across remarkably many of the hybrid circuits, which is notably different from that in percolation. We contrast our results with limiting cases where a geometrical minimal-cut picture is available.
7 More- Received 30 April 2021
- Accepted 2 July 2021
DOI:https://doi.org/10.1103/PRXQuantum.2.030313
Published by the American Physical Society under the terms of the Creative Commons Attribution 4.0 International license. Further distribution of this work must maintain attribution to the author(s) and the published article's title, journal citation, and DOI.
Published by the American Physical Society
Physics Subject Headings (PhySH)
Popular Summary
One key feature of quantum systems is entanglement, which involves correlations between two or more microscopic particles generated after they interact. Being fundamentally different from any classical correlation in the macroscopic world, quantum entanglement gives rise to many of the peculiarities of quantum mechanics. Quite generally, an isolated quantum system will become highly entangled, due to the interactions between its constituent particles. However, recently researchers discovered that such proliferation of entanglement can be hindered by frequently measuring the system. In particular, the amount of entanglement in the system will go through a sudden change when the frequency of measurement exceeds some threshold, a phenomenon named measurement-induced criticality (MIC).
In this work, we study detailed aspects of entanglement at MIC, with an emphasis on distinguishing bipartite and multipartite entanglement. We analyze a series of models with progressive levels of complexity, and identify “generic” entanglement properties shared by the models at MIC.