Electronic Reconstruction at SrMnO3LaMnO3 Superlattice Interfaces

Şerban Smadici, Peter Abbamonte, Anand Bhattacharya, Xiaofang Zhai, Bin Jiang, Andrivo Rusydi, James N. Eckstein, Samuel D. Bader, and Jian-Min Zuo
Phys. Rev. Lett. 99, 196404 – Published 9 November 2007
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Abstract

We use resonant soft–x-ray scattering (RSXS) to study the electronic reconstruction at the interface between the Mott insulator LaMnO3 and the band insulator SrMnO3. Superlattices of these two insulators were shown previously to have both ferromagnetism and metallic tendencies [Koida et al., Phys. Rev. B 66, 144418 (2002)]. By studying a judiciously chosen superlattice reflection, we show that the interface density of states exhibits a pronounced peak at the Fermi level, similar to that predicted in related titanate superlattices by Okamoto et al. [Phys. Rev. B 70, 241104(R) (2004)]. The intensity of this peak correlates with the conductivity and magnetization, suggesting it is the driver of metallic behavior. Our study demonstrates a general strategy for using RSXS to probe the electronic properties of heterostructure interfaces.

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  • Received 31 May 2007

DOI:https://doi.org/10.1103/PhysRevLett.99.196404

©2007 American Physical Society

Authors & Affiliations

Şerban Smadici1, Peter Abbamonte1, Anand Bhattacharya2, Xiaofang Zhai1, Bin Jiang1, Andrivo Rusydi3, James N. Eckstein1, Samuel D. Bader2, and Jian-Min Zuo1

  • 1Frederick Seitz Materials Research Laboratory, University of Illinois, Urbana, Illinois 61801, USA
  • 2Center for Nanoscale Materials and Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439, USA
  • 3Institute of Applied Physics, University of Hamburg, D-20355 Hamburg, Germany

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Issue

Vol. 99, Iss. 19 — 9 November 2007

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