Q. Xu1,2, I. D. Sharp1,2, C. W. Yuan1,2, D. O. Yi3,2, C. Y. Liao1,2, A. M. Glaeser1,2, A. M. Minor4, J. W. Beeman2, M. C. Ridgway5, P. Kluth5, J. W. Ager, III2, D. C. Chrzan1,2, and E. E. Haller1,2
- 1Department of Materials Science & Engineering University of California Berkeley, California 94720, USA
- 2Materials Sciences Division Lawrence Berkeley National Laboratory Berkeley, California 94720, USA
- 3Applied Science & Technology University of California Berkeley, California 94720, USA
- 4National Center for Electron Microscopy Lawrence Berkeley National Laboratory Berkeley, California 94720, USA
- 5Department of Electronic Materials Engineering Research School of Physical Sciences and Engineering Australian National University Canberra ACT 0200, Australia