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Scaling of Resistance and Electron Mean Free Path of Single-Walled Carbon Nanotubes

Meninder S. Purewal, Byung Hee Hong, Anirudhh Ravi, Bhupesh Chandra, James Hone, and Philip Kim
Phys. Rev. Lett. 98, 186808 – Published 4 May 2007

Abstract

We present an experimental investigation on the scaling of resistance in individual single-walled carbon nanotube devices with channel lengths that vary 4 orders of magnitude on the same sample. The electron mean free path is obtained from the linear scaling of resistance with length at various temperatures. The low temperature mean free path is determined by impurity scattering, while at high temperature, the mean free path decreases with increasing temperature, indicating that it is limited by electron-phonon scattering. An unusually long mean free path at room temperature has been experimentally confirmed. Exponentially increasing resistance with length at extremely long length scales suggests anomalous localization effects.

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  • Received 25 January 2007

DOI:https://doi.org/10.1103/PhysRevLett.98.186808

©2007 American Physical Society

Authors & Affiliations

Meninder S. Purewal1, Byung Hee Hong2, Anirudhh Ravi2, Bhupesh Chandra3, James Hone3, and Philip Kim2

  • 1Department of Applied Physics and Applied Math, Columbia University, New York, New York 10027, USA
  • 2Department of Physics, Columbia University, New York, New York 10027, USA
  • 3Department of Mechanical Engineering, Columbia University, New York, New York 10027, USA

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Issue

Vol. 98, Iss. 18 — 4 May 2007

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