Comment on “Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors”

S. Sadewasser and Th. Glatzel
Phys. Rev. Lett. 98, 269701 – Published 28 June 2007

Abstract

A Comment on the Letter by Y. Lu et al., Phys. Rev. Lett. 97, 076805 (2006). The authors of the Letter offer a Reply.

  • Received 28 November 2006

DOI:https://doi.org/10.1103/PhysRevLett.98.269701

©2007 American Physical Society

Authors & Affiliations

S. Sadewasser1 and Th. Glatzel2

  • 1Hahn-Meitner Institut Glienicker Strasse 100 D-14109 Berlin, Germany
  • 2Institute of Physics University of Basel Klingelbergstrasse 82 CH-4056 Basel, Switzerland

Comments & Replies

Lu et al. Reply:

Yonghua Lu, M. Munoz, C. S. Steplecaru, Cheng Hao, Ming Bai, N. Garcia, K. Schindler, D. Spoddig, and P. Esquinazi
Phys. Rev. Lett. 98, 269702 (2007)

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Original Article

Electrostatic Force Microscopy on Oriented Graphite Surfaces: Coexistence of Insulating and Conducting Behaviors

Yonghua Lu, M. Muñoz, C. S. Steplecaru, Cheng Hao, Ming Bai, N. Garcia, K. Schindler, and P. Esquinazi
Phys. Rev. Lett. 97, 076805 (2006)

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Issue

Vol. 98, Iss. 26 — 29 June 2007

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