Spatial Extent of Wave Functions of Gate-Induced Hole Carriers in Pentacene Field-Effect Devices as Investigated by Electron Spin Resonance

Kazuhiro Marumoto, Shin-ichi Kuroda, Taishi Takenobu, and Yoshihiro Iwasa
Phys. Rev. Lett. 97, 256603 – Published 22 December 2006

Abstract

An electron spin resonance (ESR) method is applied to a pentacene field-effect device to investigate gate-induced hole carriers in such devices. Clear field-induced ESR signals are observed, demonstrating that all of the field-injected carriers have S=1/2 spins. Anisotropic ESR signals due to unpaired π electrons show the molecular orientation at the interface in the devices. The spatial extent of the spin density distribution (wave function) of the carriers is evaluated from the ESR linewidth, accounting for the hyperfine structure, to be of the order of 10 molecules.

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  • Received 24 March 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.256603

©2006 American Physical Society

Authors & Affiliations

Kazuhiro Marumoto1,*, Shin-ichi Kuroda1, Taishi Takenobu2,3, and Yoshihiro Iwasa2,3

  • 1Department of Applied Physics, Nagoya University, Nagoya 464-8603, Japan
  • 2Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan
  • 3CREST, Japan Science and Technology Corporation, Kawaguchi 332-0012, Japan

  • *Present address: Institute of Materials Science, University of Tsukuba, Tsukuba 305-8573, Japan. Electronic address: marumoto@ims.tsukuba.ac.jp

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Issue

Vol. 97, Iss. 25 — 22 December 2006

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