Trapped Electromagnetic Modes and Scaling in the Transmittance of Perforated Metal Films

S. Selcuk, K. Woo, D. B. Tanner, A. F. Hebard, A. G. Borisov, and S. V. Shabanov
Phys. Rev. Lett. 97, 067403 – Published 10 August 2006

Abstract

We describe measurements and simulations of the enhanced transmittance by subwavelength hole arrays in silver films. The array period and hole size are systematically varied to give peak transmittances at wavelengths spanning a factor of 14. The spectra coincide when scaled using the array geometry and substrate refractive index alone, thus showing no significant dependence on the dielectric function of the metal. We argue that the spectra can be explained by interference of diffractive and resonant scattering. The resonant contribution comes from electromagnetic modes trapped in the film vicinity.

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  • Received 15 May 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.067403

©2006 American Physical Society

Authors & Affiliations

S. Selcuk, K. Woo, D. B. Tanner, and A. F. Hebard

  • Department of Physics, University of Florida, Gainesville, Florida 32611, USA

A. G. Borisov1 and S. V. Shabanov2,*

  • 1Laboratoire des Collisions Atomiques et Moléculaires, UMR CNRS-Université Paris-Sud 8625, Bâtiment 351, Université Paris-Sud, 91405 Orsay CEDEX, France
  • 2Department of Mathematics, University of Florida, Gainesville, Florida 32611, USA

  • *Corresponding author. Electronic address: shabanov@phys.ufl.edu

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Vol. 97, Iss. 6 — 11 August 2006

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