General Theory of Amplitude-Modulation Atomic Force Microscopy

Manhee Lee and Wonho Jhe
Phys. Rev. Lett. 97, 036104 – Published 19 July 2006

Abstract

We present a general analytical theory that enables one to determine accurately the unknown tip-sample interactions from the experimental measurement of the amplitude and phase of the oscillating tip in amplitude-modulation atomic force microscopy (AM-AFM). We apply the method to the known Lennard-Jones-type forces and find excellent agreement with the reconstructed results. AM-AFM, widely used in air and liquid, is now not only an imaging tool but also a quantitative force measurement tool.

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  • Received 10 March 2006

DOI:https://doi.org/10.1103/PhysRevLett.97.036104

©2006 American Physical Society

Authors & Affiliations

Manhee Lee and Wonho Jhe*

  • School of Physics and Astronomy, Seoul National University, Seoul 151-747, Korea

  • *Corresponding author. Email address: whjhe@snu.ac.kr

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Issue

Vol. 97, Iss. 3 — 21 July 2006

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