Dielectric Fluctuations and the Origins of Noncontact Friction

Seppe Kuehn, Roger F. Loring, and John A. Marohn
Phys. Rev. Lett. 96, 156103 – Published 20 April 2006; Erratum Phys. Rev. Lett. 96, 179902 (2006)

Abstract

Dielectric fluctuations underlie a wide variety of physical phenomena, from ion mobility in electrolyte solutions and decoherence in quantum systems to dynamics in glass-forming materials and conformational changes in proteins. Here we show that dielectric fluctuations also lead to noncontact friction. Using high sensitivity, custom fabricated, single crystal silicon cantilevers we measure energy losses over poly(methyl methacrylate), poly(vinyl acetate), and polystyrene thin films. A new theoretical analysis, relating noncontact friction to the dielectric response of the film, is consistent with our experimental observations. This work constitutes the first direct, mechanical detection of noncontact friction due to dielectric fluctuations.

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  • Received 13 January 2006
  • Publisher error corrected 24 April 2006

DOI:https://doi.org/10.1103/PhysRevLett.96.156103

©2006 American Physical Society

Corrections

24 April 2006

Erratum

Publisher’s Note: Dielectric Fluctuations and the Origins of Noncontact Friction [Phys. Rev. Lett. 96, 156103 (2006)]

Seppe Kuehn, Roger F. Loring, and John A. Marohn
Phys. Rev. Lett. 96, 179902 (2006)

Authors & Affiliations

Seppe Kuehn, Roger F. Loring, and John A. Marohn

  • Department of Chemistry and Chemical Biology, Cornell University, Ithaca, New York 14853-1301, USA

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Issue

Vol. 96, Iss. 15 — 21 April 2006

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