Quantum Metrology

Vittorio Giovannetti, Seth Lloyd, and Lorenzo Maccone
Phys. Rev. Lett. 96, 010401 – Published 3 January 2006

Abstract

We point out a general framework that encompasses most cases in which quantum effects enable an increase in precision when estimating a parameter (quantum metrology). The typical quantum precision enhancement is of the order of the square root of the number of times the system is sampled. We prove that this is optimal, and we point out the different strategies (classical and quantum) that permit one to attain this bound.

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  • Received 26 September 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.010401

©2006 American Physical Society

Authors & Affiliations

Vittorio Giovannetti1, Seth Lloyd2, and Lorenzo Maccone3

  • 1NEST-CNR-INFM & Scuola Normale Superiore, Piazza dei Cavalieri 7, I-56126, Pisa, Italy
  • 2MIT, Research Laboratory of Electronics and Department of Mechanical Engineering, 77 Massachusetts Avenue, Cambridge, Massachusetts 02139, USA
  • 3QUIT–Quantum Information Theory Group, Dipartimento di Fisica “A. Volta” Università di Pavia, via Bassi 6, I-27100 Pavia, Italy

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Issue

Vol. 96, Iss. 1 — 13 January 2006

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