Full Recovery of Electron Damage in Glass at Ambient Temperatures

K. A. Mkhoyan, J. Silcox, A. Ellison, D. Ast, and R. Dieckmann
Phys. Rev. Lett. 96, 205506 – Published 26 May 2006

Abstract

An unusually complete recovery of extensive electron-beam-induced damage in a thin film of a CaOAl2O3SiO2 glass was discovered. Nanoscale measurements show that the Ca ions migrate about 10 nm away during irradiation and return during recovery. Oxygen atoms are trapped largely as molecular oxygen and do not migrate. Electron energy loss measurements demonstrate that the glass returns completely to the original compositional and structural state thus indicating that the glass is in a deep thermodynamic energy minimum.

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  • Received 23 November 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.205506

©2006 American Physical Society

Authors & Affiliations

K. A. Mkhoyan1, J. Silcox1, A. Ellison2, D. Ast3, and R. Dieckmann3

  • 1School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
  • 2Corning Incorporated, Corning, New York 14831, USA
  • 3Department of Material Science and Engineering, Cornell University, Ithaca, New York 14853, USA

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Issue

Vol. 96, Iss. 20 — 26 May 2006

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