Abstract
We propose simple schemes that can perfectly identify projective measurement apparatuses secretly chosen from a finite set. Entanglement is used in these schemes both to make possible the perfect identification and to improve the efficiency significantly. Based on these results, a brief discussion on the problem of how to appropriately define distance measures of measurements is also provided.
- Received 16 January 2006
DOI:https://doi.org/10.1103/PhysRevLett.96.200401
©2006 American Physical Society