Stress and Morphology Evolution during Island Growth

Chun-Wei Pao and David J. Srolovitz
Phys. Rev. Lett. 96, 186103 – Published 11 May 2006

Abstract

We performed a series of hybrid molecular-dynamics simulations of island growth on a substrate and monitored island stress evolution for several different island/substrate interfacial energies. Smaller (larger) interfacial energy yields islands with a stronger (weaker) compressive stress-thickness product. We present analytical results that suggest that the stress-thickness product is a linear function of the substrate coverage, with slope equal to minus the substrate surface stress, if the island is in mechanical equilibrium, and verify these results with simulation data.

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  • Received 30 December 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.186103

©2006 American Physical Society

Authors & Affiliations

Chun-Wei Pao and David J. Srolovitz

  • Department of Mechanical and Aerospace Engineering, Princeton University, Princeton, New Jersey 08544, USA
  • Princeton Institute for the Science and Technology of Materials, Princeton University, Princeton, New Jersey 08544, USA

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Issue

Vol. 96, Iss. 18 — 12 May 2006

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