Polarized Resonant Inelastic X-Ray Scattering as an Ultrafine Probe of Excited States of La2CuO4

Abhay Shukla, Matteo Calandra, Munetaka Taguchi, Akio Kotani, György Vankó, and S.-W. Cheong
Phys. Rev. Lett. 96, 077006 – Published 24 February 2006

Abstract

X-ray absorption is the standard method to probe the unoccupied density of states at a given edge. Here we show that polarized resonant inelastic x-ray scattering in La2CuO4 at the Cu K edge is extremely sensitive to the environment of the Cu atom and the fine structure in the Cu 4p density of states. Combined ab initio and many-body cluster calculations, used for the first time in such a context, show remarkable agreement with experiment. In particular, we identify a nonlocal effect, namely, a transition to off-site Cu 3d states.

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  • Received 6 June 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.077006

©2006 American Physical Society

Authors & Affiliations

Abhay Shukla1, Matteo Calandra1, Munetaka Taguchi2, Akio Kotani2,3, György Vankó4, and S.-W. Cheong5

  • 1Institut de Minéralogie et de Physique des Milieux Condensées, 4 Place Jussieu, 75252, Paris cedex 05, France
  • 2Soft X-Ray Spectroscopy Lab, RIKEN/SPring-8, 1-1-1, Sayo, Sayo, Hyogo 679-5148, Japan
  • 3Photon Factory, IMSS, High Energy Accelerator Research Organisation, Tsukuba, Ibaraki 305-0801 Japan
  • 4European Synchrotron Radiation Facility, BP 220, F-38043 Grenoble cedex, France
  • 5Department of Physics and Astronomy, Rutgers University, Piscataway, New Jersey 08854, USA

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Issue

Vol. 96, Iss. 7 — 24 February 2006

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