Bulk Electronic Structure of Metals Resolved with Scanning Tunneling Microscopy

J. I. Pascual, A. Dick, M. Hansmann, H.-P. Rust, J. Neugebauer, and K. Horn
Phys. Rev. Lett. 96, 046801 – Published 1 February 2006

Abstract

We demonstrate that bulk band structure can have a strong influence in scanning tunneling microscopy measurements by resolving electronic interference patterns associated with scattering phenomena of bulk states at a metal surface and reconstructing the bulk band topology. Our data reveal that bulk information can be detected because states at the edge of the surface-projected bulk band have a predominant role on the scattering patterns. With the aid of density functional calculations, we associate this effect with an intrinsic increase in the projected density of states of edge states. This enhancement is characteristic of the three-dimensional bulk band curvature, a phenomenon analog to a van Hove singularity.

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  • Received 12 September 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.046801

©2006 American Physical Society

Authors & Affiliations

J. I. Pascual1, A. Dick2,3, M. Hansmann4, H.-P. Rust4, J. Neugebauer2,3, and K. Horn4

  • 1Institut für Experimentalphysik, Freie Universität Berlin, Arnimallee 14, 14195 Berlin, Germany
  • 2Max-Planck-Institut für Eisenforschung, Max-Planck-Str. 1, 40237 Düsseldorf, Germany
  • 3Universität Paderborn, Warburger Str. 100, 33098 Paderborn, Germany
  • 4Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4–6, 14195 Berlin, Germany

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Vol. 96, Iss. 4 — 3 February 2006

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