Experimental Evidence for Modulations in the Relative Double-Photoionization Cross Section of C60 from Threshold up to 280 eV

P. N. Juranić, D. Lukić, K. Barger, and R. Wehlitz
Phys. Rev. Lett. 96, 023001 – Published 18 January 2006

Abstract

The relative double-photoionization cross section of neutral C60 clusters was investigated using monochromatized synchrotron radiation between 18 and 283 eV. Our measurement of the double-to-single photoionization ratio reveals two modulating components that are superimposed on a smooth ratio curve from threshold (19.0 eV) up to 280 eV, when inner-shell excitations become possible. The maxima in the modulation can be related to geometrical dimensions of the C60 cluster.

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  • Received 30 September 2005

DOI:https://doi.org/10.1103/PhysRevLett.96.023001

©2006 American Physical Society

Authors & Affiliations

P. N. Juranić1, D. Lukić2, K. Barger3, and R. Wehlitz1,*

  • 1Synchrotron Radiation Center, University of Wisconsin, Stoughton, Wisconsin 53589, USA
  • 2Institute of Physics, 11001 Belgrade, Serbia and Montenegro
  • 3Western Washington University, Bellingham, Washington 98225, USA

  • *Electronic address: wehlitz@src.wisc.edu

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Issue

Vol. 96, Iss. 2 — 20 January 2006

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