Fault-Tolerant Quantum Dynamical Decoupling

K. Khodjasteh and D. A. Lidar
Phys. Rev. Lett. 95, 180501 – Published 26 October 2005

Abstract

Dynamical decoupling pulse sequences have been used to extend coherence times in quantum systems ever since the discovery of the spin-echo effect. Here we introduce a method of recursively concatenated dynamical decoupling pulses, designed to overcome both decoherence and operational errors. This is important for coherent control of quantum systems such as quantum computers. For bounded-strength, non-Markovian environments, such as for the spin-bath that arises in electron- and nuclear-spin based solid-state quantum computer proposals, we show that it is strictly advantageous to use concatenated pulses, as opposed to standard periodic dynamical decoupling pulse sequences. Namely, the concatenated scheme is both fault tolerant and superpolynomially more efficient, at equal cost. We derive a condition on the pulse noise level below which concatenation is guaranteed to reduce decoherence.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 3 June 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.180501

©2005 American Physical Society

Authors & Affiliations

K. Khodjasteh1 and D. A. Lidar2,3

  • 1Physics Department, University of Toronto, 60 St. George St., Toronto, Ontario, Canada M5S 1A7
  • 2Chemistry Department, University of Toronto, 80 St. George St., Toronto, Ontario, Canada M5S 3H6
  • 3Department of Chemistry and Department of Electrical Engineering-Systems, University of Southern California, Los Angeles, California 90089, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 95, Iss. 18 — 28 October 2005

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×