Shot-Noise-Driven Escape in Hysteretic Josephson Junctions

J. P. Pekola, T. E. Nieminen, M. Meschke, J. M. Kivioja, A. O. Niskanen, and J. J. Vartiainen
Phys. Rev. Lett. 95, 197004 – Published 3 November 2005

Abstract

We have measured the influence of shot noise on hysteretic Josephson junctions initially in the macroscopic quantum tunneling regime. The escape threshold current into the resistive state decreases monotonically with increasing average current through the scattering conductor, which is another tunnel junction. Escape is predominantly determined by excitation due to the wideband shot noise. This process is equivalent to thermal activation (TA) over the barrier at effective temperatures up to about 4 times the critical temperature of the superconductor. The presented TA model is in excellent agreement with the experimental results.

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  • Received 18 February 2005

DOI:https://doi.org/10.1103/PhysRevLett.95.197004

©2005 American Physical Society

Authors & Affiliations

J. P. Pekola1, T. E. Nieminen1, M. Meschke1, J. M. Kivioja1, A. O. Niskanen1,2, and J. J. Vartiainen1

  • 1Low Temperature Laboratory, Helsinki University of Technology, P.O. Box 3500, 02015 TKK, Finland
  • 2VTT Information Technology, Microsensing, P.O. Box 1207, 02044 VTT, Finland

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Issue

Vol. 95, Iss. 19 — 4 November 2005

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