Imaging Spin Flows in Semiconductors Subject to Electric, Magnetic, and Strain Fields

S. A. Crooker and D. L. Smith
Phys. Rev. Lett. 94, 236601 – Published 15 June 2005

Abstract

Using scanning Kerr microscopy, we directly acquire two-dimensional images of spin-polarized electrons flowing laterally in bulk epilayers of nGaAs. Optical injection provides a local dc source of polarized electrons, whose subsequent drift and/or diffusion is controlled with electric, magnetic, and—in particular—strain fields. Spin precession induced by controlled uniaxial stress along the 110 axes demonstrates the direct k-linear spin-orbit coupling of electron spin to the shear (off diagonal) components of the strain tensor, ϵxy.

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  • Received 18 November 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.236601

©2005 American Physical Society

Authors & Affiliations

S. A. Crooker and D. L. Smith

  • Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

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Issue

Vol. 94, Iss. 23 — 17 June 2005

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