Electrostatics of Individual Single-Walled Carbon Nanotubes Investigated by Electrostatic Force Microscopy

M. Paillet, P. Poncharal, and A. Zahab
Phys. Rev. Lett. 94, 186801 – Published 9 May 2005

Abstract

We report an experimental study of static charge distribution in individual single-walled carbon nanotubes grown on a Si+115nm SiO2 substrate. From these experiments, we conclude that charges are distributed uniformly along the nanotubes. We demonstrate that electrostatic force microscopy can accurately measure the amount of charges per unit length. We found that this amount is diameter dependent and in the range of 1 electron per nanometer for a 2.5 nm nanotube at a potential of 3.5V.

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  • Received 18 November 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.186801

©2005 American Physical Society

Authors & Affiliations

M. Paillet, P. Poncharal, and A. Zahab

  • Groupe de Dynamique des Phases Condensées (UMR CNRS 5581), Université Montpellier II, 34095 Montpellier Cedex 5, France

Comments & Replies

Comment on “Electrostatics of Individual Single-Walled Carbon Nanotubes Investigated by Electrostatic Force Microscopy”

M. Zdrojek, T. Mélin, H. Diesinger, D. Stiévenard, W. Gebicki, and L. Adamowicz
Phys. Rev. Lett. 96, 039703 (2006)

Paillet, Poncharal, and Zahab Reply:

M. Paillet, P. Poncharal, and A. Zahab
Phys. Rev. Lett. 96, 039704 (2006)

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Vol. 94, Iss. 18 — 13 May 2005

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