Stability of the DX Center in GaAs Quantum Dots

Jingbo Li, Su-Huai Wei, and Lin-Wang Wang
Phys. Rev. Lett. 94, 185501 – Published 9 May 2005

Abstract

Using a first-principles band structure method, we study how the size of quantum dots affects the stability and transition energy levels of defects in GaAs. We show that, although a negatively charged DX center is unstable in bulk GaAsSi with respect to the tetrahedral coordinated SiGa, it becomes stable when the dot size is small enough. The critical size of the dot is about 14.5 nm in diameter. The reason for the stabilization is the strong quantum-confinement effect, which increases the formation energy of SiGa more than that of the DX defect center. Our studies show that defect properties in quantum dots could be significantly different from those in bulk semiconductors.

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  • Received 18 January 2005

DOI:https://doi.org/10.1103/PhysRevLett.94.185501

©2005 American Physical Society

Authors & Affiliations

Jingbo Li* and Su-Huai Wei

  • National Renewable Energy Laboratory, Golden, Colorado 80401, USA

Lin-Wang Wang

  • Lawrence Berkeley National Laboratory, Berkeley, California 94720, USA

  • *Electronic address: jingbo_li@nrel.gov

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Issue

Vol. 94, Iss. 18 — 13 May 2005

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