Conductance of a Perfect Thin Film with Diffuse Surface Scattering

Gerd Bergmann
Phys. Rev. Lett. 94, 106801 – Published 18 March 2005

Abstract

The conductance of thin films with diffusive surface scattering was solved semiclassically by Fuchs and Sondheimer. However, when the intrinsic electron mean free path is very large or infinite their conductance diverges. In this Letter a simple diffraction picture is presented. It yields a conductance which corresponds to a limiting mean free path of a2/λF, where a is the film thickness.

  • Figure
  • Figure
  • Received 12 June 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.106801

©2005 American Physical Society

Authors & Affiliations

Gerd Bergmann

  • Physics Department, University of Southern California, Los Angeles, California 90089-0484, USA

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 94, Iss. 10 — 18 March 2005

Reuse & Permissions
Access Options

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×