Observed Effects of a Changing Step-Edge Density on Thin-Film Growth Dynamics

Aaron Fleet, Darren Dale, Y. Suzuki, and J. D. Brock
Phys. Rev. Lett. 94, 036102 – Published 25 January 2005

Abstract

We grew SrTiO3 on SrTiO3(001) by pulsed laser deposition, while observing x-ray diffraction at the (0012) position. The drop ΔI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts ΔII=4σ(1σ), so that ΔII depends only on the amount of deposited material σ. In contrast, we observed experimentally that |ΔII|<4σ(1σ) and that ΔII depends on the phase of x-ray growth oscillations. The combined results suggest a fast smoothing mechanism that depends on surface step-edge density.

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  • Received 31 August 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.036102

©2005 American Physical Society

Authors & Affiliations

Aaron Fleet1,2, Darren Dale3,2, Y. Suzuki4, and J. D. Brock1,2

  • 1School of Applied and Engineering Physics, Cornell University, Ithaca, New York 14853, USA
  • 2Cornell Center for Materials Research, Cornell University, Ithaca, New York 14853, USA
  • 3Department of Materials Science and Engineering, Cornell University, Ithaca, New York 14853, USA
  • 4Department of Materials Science and Engineering, UC Berkeley, Berkeley, California 94720, USA

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Issue

Vol. 94, Iss. 3 — 28 January 2005

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