Deceleration and Electrostatic Trapping of OH Radicals

Sebastiaan Y. T. van de Meerakker, Paul H. M. Smeets, Nicolas Vanhaecke, Rienk T. Jongma, and Gerard Meijer
Phys. Rev. Lett. 94, 023004 – Published 18 January 2005

Abstract

A pulsed beam of ground state OH radicals is slowed down using a Stark decelerator and is subsequently loaded into an electrostatic trap. Characterization of the molecular beam production, deceleration, and trap loading process is performed via laser induced fluorescence detection inside the quadrupole trap. Depending on the details of the trap loading sequence, typically 105 OH (X2Π3/2,J=3/2) radicals are trapped at a density of around 107cm3 and at temperatures in the 50–500 mK range. The 1/e trap lifetime is around 1.0 s.

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  • Received 22 July 2004

DOI:https://doi.org/10.1103/PhysRevLett.94.023004

©2005 American Physical Society

Authors & Affiliations

Sebastiaan Y. T. van de Meerakker1,2, Paul H. M. Smeets2, Nicolas Vanhaecke1, Rienk T. Jongma3, and Gerard Meijer1

  • 1Fritz-Haber-Institut der Max-Planck-Gesellschaft, Faradayweg 4-6, 14195 Berlin, Germany
  • 2FOM-Institute for Plasmaphysics Rijnhuizen, Edisonbaan 14, 3439 MN Nieuwegein, The Netherlands
  • 3Space Research Organization Netherlands, Sorbonnelaan 2, 3584 CA Utrecht, The Netherlands

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Issue

Vol. 94, Iss. 2 — 21 January 2005

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