Quantum Process Tomography of a Controlled-NOT Gate

J. L. O'Brien, G. J. Pryde, A. Gilchrist, D. F. V. James, N. K. Langford, T. C. Ralph, and A. G. White
Phys. Rev. Lett. 93, 080502 – Published 20 August 2004
PDFHTMLExport Citation

Abstract

We demonstrate complete characterization of a two-qubit entangling process—a linear optics controlled-not gate operating with coincident detection—by quantum process tomography. We use a maximum-likelihood estimation to convert the experimental data into a physical process matrix. The process matrix allows an accurate prediction of the operation of the gate for arbitrary input states and a calculation of gate performance measures such as the average gate fidelity, average purity, and entangling capability of our gate, which are 0.90, 0.83, and 0.73, respectively.

  • Figure
  • Figure
  • Received 29 January 2004

DOI:https://doi.org/10.1103/PhysRevLett.93.080502

©2004 American Physical Society

Authors & Affiliations

J. L. O'Brien1,*, G. J. Pryde1,*, A. Gilchrist1, D. F. V. James2, N. K. Langford1,*, T. C. Ralph1, and A. G. White1,*

  • 1Centre for Quantum Computer Technology and Physics Department, University of Queensland, Brisbane 4072, Australia
  • 2Theoretical Division T-4, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA

  • *Electronic address: www.quantinfo.org

Article Text (Subscription Required)

Click to Expand

Supplemental Material (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 93, Iss. 8 — 20 August 2004

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×