Enhanced Electron-Capture Decay Rate of B7e Encapsulated in C60 Cages

T. Ohtsuki, H. Yuki, M. Muto, J. Kasagi, and K. Ohno
Phys. Rev. Lett. 93, 112501 – Published 9 September 2004

Abstract

The decay rate of B7e electron capture was measured in C60 and Be metal with a reference method. The half-life of B7e endohedral C60 (B7e@C60) and B7e in Be metal (Be metal (B7e)) is found to be 52.68±0.05 and 53.12±0.05 days, respectively. This amounts to a 0.83% difference in electron-capture decay half-life between B7e@C60 and Be metal (B7e). Our result is a reflection of the different electron wave functions for B7e@C60 inside C60 compared to the situation when B7e is in a Be metal.

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  • Received 18 February 2004

DOI:https://doi.org/10.1103/PhysRevLett.93.112501

©2004 American Physical Society

Authors & Affiliations

T. Ohtsuki1, H. Yuki1, M. Muto1, J. Kasagi1, and K. Ohno2

  • 1Laboratory of Nuclear Science, Tohoku University, 1-2-1 Mikamine, Taihaku, Sendai 982-0826, Japan
  • 2Department of Physics, Yokohama National University,79-5 Tokiwadai, Hodogaya, Yokohama 240-8501, Japan

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Vol. 93, Iss. 11 — 10 September 2004

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