Probing Individual Localization Centers in an InGaN/GaN Quantum Well

H. Schömig, S. Halm, A. Forchel, G. Bacher, J. Off, and F. Scholz
Phys. Rev. Lett. 92, 106802 – Published 12 March 2004

Abstract

Photoluminescence (PL) spectroscopy with subwavelength lateral resolution has been employed to probe individual localization centers in a thin InGaN/GaN quantum well. Spectrally narrow emission lines with a linewidth as small as 0.8 meV can be resolved, originating from the recombination of an electron-hole pair occupying a single localized state. Surprisingly, the individual emission lines show a pronounced blueshift when raising the temperature, while virtually no energy shift occurs for increasing excitation density. These findings are in remarkable contrast to the behavior usually found in macro-PL measurements and give a fundamental new insight into the recombination process in semiconductor nanostructures in the presence of localization and strong internal electric fields. We find clear indications for a biexciton state with a negative binding energy of about 5±0.7meV.

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  • Received 6 August 2003

DOI:https://doi.org/10.1103/PhysRevLett.92.106802

©2004 American Physical Society

Authors & Affiliations

H. Schömig1, S. Halm1,2, A. Forchel1, and G. Bacher1,2,*

  • 1Technische Physik, Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany
  • 2Werkstoffe der Elektrotechnik, Universität Duisburg-Essen, Bismarckstrasse 81, D-47057 Duisburg, Germany

J. Off1 and F. Scholz1,2

  • 14. Physikalisches Institut, Universität Stuttgart, D-70550 Stuttgart, Germany
  • 2Abteilung Optoelektronik, Universität Ulm, Albert-Einstein-Allee 45, D-89069 Ulm, Germany

  • *Electronic address: g.bacher@uni-duisburg.de

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Issue

Vol. 92, Iss. 10 — 12 March 2004

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