Interfacial Melting of Ice in Contact with SiO2

S. Engemann, H. Reichert, H. Dosch, J. Bilgram, V. Honkimäki, and A. Snigirev
Phys. Rev. Lett. 92, 205701 – Published 17 May 2004

Abstract

The physical behavior of condensed matter can be drastically altered in the presence of interfaces. Using a high-energy x-ray transmission-reflection scheme, we have studied ice-SiO2 model interfaces. We observed the formation of a quasiliquid layer below the bulk melting temperature and determined its thickness and density as a function of temperature. The quasiliquid layer has stronger correlations than water and a large density close to ρHDA=1.17g/cm3 of high-density amorphous ice suggesting a structural relationship with the postulated high-density liquid phase of water.

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  • Received 15 January 2004

DOI:https://doi.org/10.1103/PhysRevLett.92.205701

©2004 American Physical Society

Authors & Affiliations

S. Engemann1, H. Reichert1, H. Dosch1,2, J. Bilgram3, V. Honkimäki4, and A. Snigirev4

  • 1Max-Planck-Institut für Metallforschung, Heisenbergstrasse 3, D-70569 Stuttgart, Germany
  • 2Institut für Theoretische und Angewandte Physik, Universität Stuttgart, D-70569 Stuttgart, Germany
  • 3Laboratorium für Festkörperphysik, ETH Zürich, CH-8093 Zürich, Switzerland
  • 4European Synchrotron Radiation Facility, F-38043 Grenoble, France

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Issue

Vol. 92, Iss. 20 — 21 May 2004

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