Role of Mobile Interstitial Oxygen Atoms in Defect Processes in Oxides: Interconversion between Oxygen-Associated Defects in SiO2 Glass

Koichi Kajihara, Linards Skuja, Masahiro Hirano, and Hideo Hosono
Phys. Rev. Lett. 92, 015504 – Published 9 January 2004

Abstract

The role of mobile interstitial oxygen atoms (O0) in defect processes in oxides is demonstrated by interconversion between the oxygen dangling bond and the peroxy radical (POR) in SiO2 glass. Superstoichiometric O0 was created by F2 laser photolysis of the interstitial O2. On annealing above 300°C, O0 migrated and converted the oxygen dangling bond to POR. Exposure to 5.0 eV light converted POR back to a pair of the oxygen dangling bond and O0 (quantum yield: 0.1). These findings suggest that various defect processes typically occurring in SiO2 glass at 300500°C are related to migration of O0, which exists in the glass network in the peroxy linkage form.

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  • Received 18 June 2003

DOI:https://doi.org/10.1103/PhysRevLett.92.015504

©2004 American Physical Society

Authors & Affiliations

Koichi Kajihara1,*, Linards Skuja1,2, Masahiro Hirano1, and Hideo Hosono1,3

  • 1Transparent Electro-Active Materials Project, ERATO, Japan Science and Technology Agency, KSP C-1232, 3-2-1 Sakado Takatsu-ku, Kawasaki 213-0012, Japan
  • 2Institute of Solid State Physics, University of Latvia, Kengaraga iela 8, LV1063 Riga, Latvia
  • 3Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Midori-ku, Yokohama 226-8503, Japan

  • *Author to whom correspondence should be addressed. Electronic address: k-kajihara@net.ksp.or.jp

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Issue

Vol. 92, Iss. 1 — 9 January 2004

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