Focusing X-Ray Beams to Nanometer Dimensions

C. Bergemann, H. Keymeulen, and J. F. van der Veen
Phys. Rev. Lett. 91, 204801 – Published 10 November 2003

Abstract

We address the question: what is the smallest spot size to which an x-ray beam can be focused? We show that confinement of the beam within a narrowly tapered waveguide leads to a theoretical minimum beam size of the order of 10 nm (FWHM), the exact value depending only on the electron density of the confining material. This limit appears to apply to all x-ray focusing devices. Mode mixing and interference can help to achieve this spot size without the need for ultrasmall apertures.

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  • Received 27 June 2003

DOI:https://doi.org/10.1103/PhysRevLett.91.204801

©2003 American Physical Society

Authors & Affiliations

C. Bergemann1,*, H. Keymeulen2, and J. F. van der Veen2

  • 1Laboratorium für Festkörperphysik, ETH-Hönggerberg, CH-8093 Zürich, Switzerland
  • 2Paul Scherrer Institut, CH-5232 Villigen, Switzerland and ETH-Zürich, Zürich, Switzerland

  • *Present address: Cavendish Laboratory, University of Cambridge, Madingley Road, Cambridge CB3 0HE, United Kingdom.

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Issue

Vol. 91, Iss. 20 — 14 November 2003

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