Abstract
We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges () are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise, and high current cumulants in a variety of situations can be obtained from our result.
- Received 4 August 2003
DOI:https://doi.org/10.1103/PhysRevLett.91.187001
©2003 American Physical Society