Full Counting Statistics of Multiple Andreev Reflections

J. C. Cuevas and W. Belzig
Phys. Rev. Lett. 91, 187001 – Published 28 October 2003

Abstract

We derive the full distribution of transmitted particles through a superconducting point contact of arbitrary transparency under voltage bias. The charge transport is dominated by multiple Andreev reflections. The counting statistics is a multinomial distribution of processes, in which multiple charges ne (n=1,2,3,) are transferred through the contact. For zero temperature we obtain analytical expressions for the probabilities of the multiple Andreev reflections. The current, shot noise, and high current cumulants in a variety of situations can be obtained from our result.

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  • Received 4 August 2003

DOI:https://doi.org/10.1103/PhysRevLett.91.187001

©2003 American Physical Society

Authors & Affiliations

J. C. Cuevas1 and W. Belzig2

  • 1Institut für Theoretische Festkörperphysik, Universität Karlsruhe, D-76128 Karlsruhe, Germany
  • 2Department of Physics and Astronomy, University of Basel, Klingelbergstrasse 82, CH-4056 Basel, Switzerland

See Also

Full Counting Statistics of Multiple Andreev Reflection

Göran Johansson, Peter Samuelsson, and Åke Ingerman
Phys. Rev. Lett. 91, 187002 (2003)

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Vol. 91, Iss. 18 — 31 October 2003

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