Grains, Growth, and Grooving

M. J. Rost, D. A. Quist, and J. W. M. Frenken
Phys. Rev. Lett. 91, 026101 – Published 7 July 2003
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Abstract

We report the in situ investigation of grain growth and grain boundary migration, performed with a variable-temperature scanning tunneling microscope (STM) on a polycrystalline gold film. Atomic step resolution allowed us to identify the individual grains and, thus, also the grain boundaries. Our special, thermal-drift-compensated STM design made it possible to follow the same sample area over large temperature intervals. In this way, we have directly observed grain boundary migration and grain growth. In a first quantitative analysis we correlate the observed, unexpected changes in surface roughness with the evolution of the grain and grain boundary configuration.

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  • Received 7 November 2002

DOI:https://doi.org/10.1103/PhysRevLett.91.026101

©2003 American Physical Society

Authors & Affiliations

M. J. Rost, D. A. Quist, and J. W. M. Frenken

  • Kamerlingh Onnes Laboratory, Leiden University, P.O. Box 9504, 2300 RA Leiden, The Netherlands

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Issue

Vol. 91, Iss. 2 — 11 July 2003

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