Resistance Noise Scaling in a Dilute Two-Dimensional Hole System in GaAs

R. Leturcq, D. L’Hôte, R. Tourbot, C. J. Mellor, and M. Henini
Phys. Rev. Lett. 90, 076402 – Published 19 February 2003

Abstract

We have measured the resistance noise of a two-dimensional (2D) hole system in a high mobility GaAs quantum well, around the 2D metal-insulator transition (MIT) at zero magnetic field. The normalized noise power SR/R2 increases strongly when the hole density ps is decreased, increases slightly with temperature (T) at the largest densities, and decreases strongly with T at low ps. The noise scales with the resistance, SR/R2R2.4, as for a second order phase transition such as a percolation transition. The ps dependence of the conductivity is consistent with a critical behavior for such a transition, near a density p* which is lower than the observed MIT critical density pc.

  • Figure
  • Figure
  • Figure
  • Figure
  • Received 24 September 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.076402

©2003 American Physical Society

Authors & Affiliations

R. Leturcq, D. L’Hôte, and R. Tourbot

  • Service de Physique de l’Etat Condensé, CEA/DSM, CE Saclay, F-91191 Gif-sur-Yvette, France

C. J. Mellor and M. Henini

  • School of Physics and Astronomy, University of Nottingham, University Park, Nottingham NG7 2RD, United Kingdom

Article Text (Subscription Required)

Click to Expand

References (Subscription Required)

Click to Expand
Issue

Vol. 90, Iss. 7 — 21 February 2003

Reuse & Permissions
Access Options
Author publication services for translation and copyediting assistance advertisement

Authorization Required


×
×

Images

×

Sign up to receive regular email alerts from Physical Review Letters

Log In

Cancel
×

Search


Article Lookup

Paste a citation or DOI

Enter a citation
×