Ancilla-Assisted Quantum Process Tomography

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, P. G. Kwiat, R. T. Thew, J. L. O’Brien, M. A. Nielsen, and A. G. White
Phys. Rev. Lett. 90, 193601 – Published 15 May 2003

Abstract

Complete and precise characterization of a quantum dynamical process can be achieved via the method of quantum process tomography. Using a source of correlated photons, we have implemented several methods, each investigating a wide range of processes, e.g., unitary, decohering, and polarizing. One of these methods, ancilla-assisted process tomography (AAPT), makes use of an additional “ancilla system,” and we have theoretically determined the conditions when AAPT is possible. Surprisingly, entanglement is not required. We present data obtained using both separable and entangled input states. The use of entanglement yields superior results, however.

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  • Received 22 November 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.193601

©2003 American Physical Society

Authors & Affiliations

J. B. Altepeter, D. Branning, E. Jeffrey, T. C. Wei, and P. G. Kwiat*

  • Department of Physics, University of Illinois at Urbana-Champaign, Urbana Illinois 61801-3080, USA

R. T. Thew, J. L. O’Brien, M. A. Nielsen, and A. G. White

  • Center for Quantum Computer Technology and School of Physical Sciences, University of Queensland, QLD 4072, Brisbane, Australia

  • *Electronic address: kwiat@uiuc.edu
  • Group of Applied Physics, University of Geneva, 1211 Geneva 4, Switzerland.
  • Electronic address: andrew@physics.uq.edu.au

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Issue

Vol. 90, Iss. 19 — 16 May 2003

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