High-Resolution Near-Field Raman Microscopy of Single-Walled Carbon Nanotubes

Achim Hartschuh, Erik J. Sánchez, X. Sunney Xie, and Lukas Novotny
Phys. Rev. Lett. 90, 095503 – Published 4 March 2003

Abstract

We present near-field Raman spectroscopy and imaging of single isolated single-walled carbon nanotubes with a spatial resolution of 25nm. The near-field origin of the image contrast is confirmed by the measured dependence of the Raman scattering signal on tip-sample distance and the unique polarization properties. The method is used to study local variations in the Raman spectrum along a single single-walled carbon nanotube.

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  • Received 9 August 2002

DOI:https://doi.org/10.1103/PhysRevLett.90.095503

©2003 American Physical Society

Authors & Affiliations

Achim Hartschuh1, Erik J. Sánchez2, X. Sunney Xie3, and Lukas Novotny1

  • 1The Institute of Optics, University of Rochester, Rochester, New York 14627
  • 2Department of Physics, Portland State University, Portland, Oregon 97207
  • 3Department of Chemistry and Chemical Biology, Harvard University, Cambridge, Massachusetts 02138

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Issue

Vol. 90, Iss. 9 — 7 March 2003

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