Atomic Resolution Three-Dimensional Electron Diffraction Microscopy

Jianwei Miao, Tetsu Ohsuna, Osamu Terasaki, Keith O. Hodgson, and Michael A. O’Keefe
Phys. Rev. Lett. 89, 155502 – Published 18 September 2002

Abstract

We report the development of a novel form of diffraction-based 3D microscopy to overcome resolution barriers inherent in high-resolution electron microscopy and tomography. By combining coherent electron diffraction with the oversampling phasing method, we show that the 3D structure of a nanocrystal can be determined ab initio at a resolution of 1 Å from 29 simulated noisy diffraction patterns. This new form of microscopy can be used to image the 3D structures of nanocrystals and noncrystalline samples, with resolution limited only by the quality of sample diffraction.

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  • Received 6 May 2002

DOI:https://doi.org/10.1103/PhysRevLett.89.155502

©2002 American Physical Society

Authors & Affiliations

Jianwei Miao1,*, Tetsu Ohsuna2, Osamu Terasaki3, Keith O. Hodgson1,4, and Michael A. O’Keefe5

  • 1Stanford Synchrotron Radiation Laboratory, Stanford Linear Accelerator Center, Stanford University, Stanford, California 94309-0210
  • 2Institute for Materials Research, Tohoku University, Sendai 980-8577, Japan
  • 3Department of Physics and CIR, Tohoku University, Sendai 980-8577, Japan
  • 4Department of Chemistry, Stanford University, Stanford, California 94305
  • 5Materials Science Division, National Center for Electron Microscopy, Lawrence Berkeley National Laboratory, Berkeley, California 94720

  • *Corresponding author. Email address: miao@ssrl.slac.stanford.edu

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Issue

Vol. 89, Iss. 15 — 7 October 2002

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