Insulating Behavior of λ-DNA on the Micron Scale

Y. Zhang, R. H. Austin, J. Kraeft, E. C. Cox, and N. P. Ong
Phys. Rev. Lett. 89, 198102 – Published 17 October 2002

Abstract

We have investigated the electrical conductivity of λ-DNA using DNA covalently bonded to Au electrodes. Thiol-modified dTTP was incorporated into the “sticky” ends of bacteriophage λ-DNA using DNA polymerase. Two-probe measurements on such molecules provide a hard lower bound for the resistivity ρ>106Ωcm at bias potentials up to 20 V, in conflict with recent claims of moderate to high conductivity. By direct imaging, we show that the molecules are present after the measurements. We stress the importance of eliminating salt residues in these measurements.

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  • Received 29 March 2002

DOI:https://doi.org/10.1103/PhysRevLett.89.198102

©2002 American Physical Society

Authors & Affiliations

Y. Zhang1, R. H. Austin1, J. Kraeft2, E. C. Cox2, and N. P. Ong1

  • 1Department of Physics, Princeton University, Princeton, New Jersey 08544
  • 2Department of Molecular Biology, Princeton University, Princeton, New Jersey 08544

Comments & Replies

Zhang et al. Reply

Y. Zhang, R. H. Austin, E. C. Cox, and N. P. Ong
Phys. Rev. Lett. 93, 239802 (2004)

Comment on “Insulating Behavior of λ-DNA on the Micron Scale”

John Bechhoefer and Dipankar Sen
Phys. Rev. Lett. 93, 239801 (2004)

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Vol. 89, Iss. 19 — 4 November 2002

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