Monitoring Statistical Magnetic Fluctuations on the Nanometer Scale

G. Bacher, A. A. Maksimov, H. Schömig, V. D. Kulakovskii, M. K. Welsch, A. Forchel, P. S. Dorozhkin, A. V. Chernenko, S. Lee, M. Dobrowolska, and J. K. Furdyna
Phys. Rev. Lett. 89, 127201 – Published 27 August 2002

Abstract

Statistical fluctuations of the magnetization are measured on the nanometer scale. As the experimental monitor we use the characteristic photoluminescence signal of a single electron-hole pair confined in one magnetic semiconductor quantum dot, which sensitively depends on the alignment of the magnetic ion spins. Quantitative access to statistical magnetic fluctuations is obtained by analyzing the linewidth broadening of the single dot emission. Our all-optical technique allows us to address a magnetic moment of only 100μB and to resolve statistical changes on the order of a few μB.

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  • Received 10 January 2002

DOI:https://doi.org/10.1103/PhysRevLett.89.127201

©2002 American Physical Society

Authors & Affiliations

G. Bacher*, A. A. Maksimov, H. Schömig, V. D. Kulakovskii, M. K. Welsch, and A. Forchel

  • Technische Physik, Universität Würzburg, Am Hubland, D-97074 Würzburg, Germany

P. S. Dorozhkin and A. V. Chernenko

  • Institute of Solid State Physics, RAS, 142432 Chernogolovka, Russia

S. Lee, M. Dobrowolska, and J. K. Furdyna

  • Department of Physics, University of Notre Dame, Notre Dame, Indiana 46556

  • *Electronic address: bacher@physik.uni-wuerzburg.de
  • On leave from: Institute of Solid State Physics, RAS, 142432 Chernogolovka, Russia.
  • Present address: Department of Physics, Korea University, Seoul 136-701, Korea.

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Issue

Vol. 89, Iss. 12 — 16 September 2002

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