Large Electron-Phonon Coupling at an Interface

D.-A. Luh, T. Miller, J. J. Paggel, and T.-C. Chiang
Phys. Rev. Lett. 88, 256802 – Published 5 June 2002
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Abstract

The strength of electron-phonon coupling in atomically uniform films of Ag on Fe is determined by angle-resolved photoemission from quantum well states in these films over a wide temperature range. As the film thickness is reduced, contributions from the surface and interface should become more important, and, experimentally, a large enhancement with superimposed quantum oscillations is observed. An analysis of the quantum oscillations indicates that this large enhancement is an interface effect.

  • Received 30 August 2001

DOI:https://doi.org/10.1103/PhysRevLett.88.256802

©2002 American Physical Society

Authors & Affiliations

D.-A. Luh1,2, T. Miller1,2, J. J. Paggel3, and T.-C. Chiang1,2,*

  • 1Department of Physics, University of Illinois at Urbana-Champaign, 1110 West Green Street, Urbana, Illinois 61801-3080
  • 2Frederick Seitz Materials Research Laboratory, University of Illinois at Urbana-Champaign, 104 South Goodwin Avenue, Urbana, Illinois 61801-2902
  • 3Freie Universität Berlin, Institut für Experimentalphysik, 14195 Berlin, Germany

  • *To whom correspondence should be addressed. Email address: chiang@mrl.uiuc.edu

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Issue

Vol. 88, Iss. 25 — 24 June 2002

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