Measurement of X-Ray Pulse Widths by Intensity Interferometry

M. Yabashi, K. Tamasaku, and T. Ishikawa
Phys. Rev. Lett. 88, 244801 – Published 31 May 2002
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Abstract

The pulse width of hard undulator radiation (32 ps width, energy 14 keV) was determined by intensity interferometry. The method, in combination with various x-ray monochromators, enables measurements to be taken over a wide range of time frames, from ns to fs. The applicable target includes measurements of ultrafast x-ray pulse widths from fourth generation synchrotron light sources.

  • Received 8 April 2002

DOI:https://doi.org/10.1103/PhysRevLett.88.244801

©2002 American Physical Society

Authors & Affiliations

M. Yabashi1, K. Tamasaku2, and T. Ishikawa1,2

  • 1SPring-8/JASRI, Mikazuki, Hyogo 679-5198, Japan
  • 2SPring-8/RIKEN, Mikazuki, Hyogo 679-5148, Japan

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Issue

Vol. 88, Iss. 24 — 17 June 2002

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